{
  "best_oa_location": null,
  "data_standard": 2,
  "doi": "10.1002/(sici)1096-9918(199907)27:7<644::aid-sia554>3.0.co;2-4",
  "doi_url": "https://doi.org/10.1002/(sici)1096-9918(199907)27:7<644::aid-sia554>3.0.co;2-4",
  "genre": "journal-article",
  "is_oa": false,
  "journal_is_in_doaj": false,
  "journal_is_oa": false,
  "journal_issns": "0142-2421,1096-9918",
  "journal_name": "Surface and Interface Analysis",
  "oa_locations": [],
  "published_date": "1999-07-01",
  "publisher": "Wiley-Blackwell",
  "title": "In situ measurement of lithium movement in thin film electrochromic coatings using cold neutron depth profiling",
  "updated": "2018-04-10T02:56:15.429231",
  "x_reported_noncompliant_copies": [],
  "year": 1999,
  "z_authors": [
    {
      "family": "Lamaze",
      "given": "G. P."
    },
    {
      "family": "Chen-Mayer",
      "given": "H."
    },
    {
      "family": "Badding",
      "given": "M."
    },
    {
      "family": "Laby",
      "given": "L."
    }
  ]
}